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Introduction to Local-Thermal Analysis via TMA (Thermo-mechanical analysis). The nano-TA probe is first used by the AFM to image with nanoscale resolution (with the normal visualization modes of the AFM) which then helps the user identify the points where they would like to get local thermal property information.
The probe is moved to the first point selected and placed on the surface of the sample. The temperature of the tip is then ramped linearly with time while the degree of bending is monitored. At the point of phase transition, the material beneath the tip softens and the probe penetrates into the sample, this provides the nanoscale equivalent of a bulk thermo-mechanical analysis experiment whereby you can measure the phase transition temperatures of the sample such as Tg or Tm. . This is illustrated in the animation.
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nano-TA of Multi-layer BOPP Film with image showing core, skin (1μm) and epoxy layer. Penetration holes are shown in the core and skin layer.
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Once you have identified the regions of thermal interest on your sample via our HT-AFM mode, you then use our nano-TA mode to go in and get quantitative measurements of phase transition temperatures (Glass Transition, Melting Point) at sub-100nm resolution which is 50x better than state-of-the-art). Here is a sampling of our application notes showing the use of nano-TA for:
Identification of a particle in a polymer film
Analyzing nanoscale inclusions in a polymer matrix
Characterizing Multilayer Biaxially oriented Polypropylene (BOPP) Films
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