COMPANY Management Team Scientific Advisors News Careers TECHNOLOGY nanoIR FAQ-nanoIR nano-TA HT-AFM PRODUCTS nanoIR nano-TA2 SThM VESTA Probes APPLICATIONS nanoscale IR Spectroscopy nanoscale Thermal Analysis SUPPORT Applications Lab Manual Technical Notes Released Software EVENTS Conferences and Tradeshows Webinars CONTACT Request Information Sales Contacts Location Products     nanoIR     nano-TA2     SThM     VESTA     Probes The nanoIR instrument Product Photos Key Specifications Multifunctional Measurements Instrument Capabilities nanoIR Software Product Photos The nanoIR platform combines a tunable IR source with an AFM measurement module to allow topographic integrated topographic and spectroscopic measurements. An integrated video microscope allows users to quickly find features of interest on samples mounted on a zinc selenide prism. The AFM measurement head enables high resolution topographic measurements along with detection of IR absorption from regions of the sample. The AFM measurement head rotates back for easy sample access. The sample can be easily exchanged without tools in less than a minute. Key Specifications   Spectral Range 1200*-3600 cm-1 Spectral Resolution <16 cm-1 Max Image Size 100 μm x 100 μm Spectral acquisition time ~1 minute per spectrum (or less) Specifications subject to change. Multifunctional Measurements With the nanoIR system, multifunctional measurements enable you to get a more complete picture of your sample, integrating topographic, spectroscopic, mechanical and thermal property mapping. High resolution topographic measurements are performed by AFM, while the photothermal induced resonance (PTIR) technique adds local chemical characterization with infrared spectroscopy. The PTIR technique also supports contact resonance frequency measurements that allows simultaneous map characterize materials in a variet. Instrument Capabilities Measurement capability Enables Photothermal induced resonance (PTIR) Chemical characterization by nanoscale infrared spectroscopy Contact resonance Simultaneous mechanical property mapping AFM High resolution surface topography Nanothermal Analysis Local measurements of thermal transition temperatures Multifunctional measurements on PET/Nylon composite material combines AFM measurements, chemical spectroscopy, chemical mapping, and nanothermal analysis. nanoIR Software Anasys Instruments nanoIR software makes it easy to acquire absorption spectra at the nanoscale. Choose an area of a sample, capture an AFM image, and then point and click on where you'd like to measure the IR spectra. The software automatically keeps track of where the spectra were obtained making it easy to correlate spatial and spectroscopic information. Spectra can be easily exported to third party spectroscopic analysis software. nanoIR applications Click here for more information    © 2010 Anasys Instruments Corporation. All rights reserved.