COMPANY Management Team Scientific Advisors News Careers TECHNOLOGY nanoIR FAQ-nanoIR nano-TA HT-AFM PRODUCTS nanoIR nano-TA2 SThM VESTA Probes APPLICATIONS nanoscale IR Spectroscopy nanoscale Thermal Analysis SUPPORT Applications Lab Manual Technical Notes Released Software EVENTS Conferences and Tradeshows Webinars CONTACT Request Information Sales Contacts Location Products     nanoIR     nano-TA2     SThM     VESTA     Probes nanoIR: This breakthrough technology combines key elements of both infrared spectroscopy and atomic force microscopy (AFM) to enable the acquisition of infrared spectra at spatial resolutions well beyond the optical diffraction limit. In addition to revealing chemical composition, the nanoIR system provides high-resolution characterization of local topographic, mechanical, and thermal properties. The powerful new measurement tool has been designed to facilitate advanced research in polymer science, materials science, and life science, including detailed studies of structure-property correlations. Potential nanoIR application areas include: Polymer blends Multilayer films/laminates Organic defect analysis Tissue morphology/histology Subcellular spectroscopy Organic photovoltaics VESTA: Please click here for a Brochure (PDF format). This is an easy-to-use local thermal analysis system which enables you to obtain transition temperatures on features of interest on your sample. The sample is imaged using an optical microscope with an optical resolution of ~1.5 microns and then you can click on a feature in the image to rapidly measure the local transition measurement. Arrays of points or programmed locations can also be measured in a fully automated mode. The system also includes the Transition Temperature Microscopy capability to generate an image of the transition temperatures across the sample surface. SThM (Scanning Thermal Microscopy): Please click here for a Data Sheet (PDF format). This module (comprising controller, software and probes) enables most AFMs to be able to map the temperature or thermal conductivity of a sample with 0.1 deg C resolution. NanoTA2: Please click here for a Data Sheet (PDF format). This is the second generation from our nano-TA family which enables sub-100nm local thermal analysis for most commercially available AFMs. This resolution is 100x better than previous technologies and is made possible by our thermal probe technology which enables you to: Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you would like to study. Analyze a local area of less than 100 nm diameter at temperatures up to 400 deg C to study thermal properties such as glass transitions or melt transitions. The local heating allows very fast heating rates up to 600,000 deg C/min and minimizes thermal drift issues that plague bulk sample heating approaches. Image with a heated tip to map or induce local thermal events over specific regions of a surface. In the SThM mode, map the temperatures across the sample with a probe temperature resolution of <0.1 deg C.        © 2010 Anasys Instruments Corporation. All rights reserved.